Centro de Micro-Análisis de Materiales

OVERVIEW
Acronym CMAM
Partner institution

Universidad Autónoma de Madrid





Description

The experimental equipment consists of the accelerator, its beam lines, dedicated to various application areas and several ancillary equipments (micro-analytical techniques, sample preparation). The accelerator is of the tandem type with 5 MV maximum terminal voltage. It is provided with two sources: a plasma source for gaseous substances and a sputtering source for obtaining practically any element of the periodic table from a solid target. The building that hosts the laboratories is located in 3 Faraday street of the Cantoblanco Campus and consists of two separate parts: the accelerator vault and the service building for offices, laboratories, and auxiliary services.

SCIENTIFIC DOMAIN
Scientific domain

PE2_6 - Nuclear, hadron and heavy ion physics - Fundamental Constituents of Matter





 

PE2_3 - Experimental particle physics with accelerators - Fundamental Constituents of Matter





 

PE4_14 - Radiation and Nuclear chemistry - Physical and Analytical Chemical Sciences





 

PE3_10 - Nanophysics, e.g. nanoelectronics, nanophotonics, nanomagnetism, nanoelectromechanics - Condensed Matter Physics





 

PE3_1 - Structure of solids, material growth and characterisation - Condensed Matter Physics





Keywords

analysis





 

Accelerator





 

materials





 

modification





INFRASTRUCTURE
Remote access details

Scientific excellence, industrial proprietary access, educational activities or beamtime assigned to a specific project with third-party funding. Open to Civis.

AMENITIES
Equipment

The accelerator may be used in combination with one of the following beamlines: 1. The Standard multiporpose line 2. The External Microbeam line 3. The ERDA-TOF line 4. The Nuclear physics line 5. The implantation line 6. The Internal Microbeam line The users can rely on installations that, by the kind of beams and instruments available and their performances (e.g. space, time, angle, energy resolution, current, fluence, etc.) allow to deal with many research topics. These are like the production and characterisation of materials at the technological edge like materials for photonics and the electronic industry; the controlled implantation of ions to modify materials properties; the high sensitivity non destructive analysis of fine arts objects and environmental samples.