Variable Pressure Scanning Electron Microscopy supported by dual Energy Dispersive X-ray Spectroscopy (VP-SEM-dEDS)
Coordinates
41.9036428022199, 12.514534957176009
Contact name
Giuseppe Familiari
CIVIS Label
No
Acronym
VP-SEM-Deds-SRI
Scientific domain
Keywords
SEM
VP
HITACHI
SU-3500
Partner institution
Sapienza Università di Roma
Website
No
Technical staff available
No
Remote access details
No
Remote access available
No
Open to external users
No
Equipment
No
Open access to updated information database
No
Online booking system details
No
Online booking system available
No
Description
Variable pressure scanning electron microscopy (VP-SEM, Hitachi SU-3500) is supported by dual energy dispersive X-ray spectroscopy detectors (dEDS) arranged in parallel configuration (Bruker, XFlash® 6|60) able to high sensitivity elemental analysis by their large active area of a 60 mm2 each.VP-SEM-dEDS is able to observe in situ non-conductive samples in their native state or better in hydrate state without using the traditional conductive coating. The dEDS offers particular advantages: (i) reduction acquisition times of X-ray spectra suitable for samples extremely sensitive to electronic radiation damage; (ii) high acquisition statistics useful for quantitative analysis of the chemical species and for high quality of the chemical imaging mapping; (iii) absence of the Shadow effect, essential for analysing samples with a highly roughness surface.
The merging of low vacuum observation with microanalysis provides both novel fundamental discoveries and new applications, giving the opportunity to observe and analyse the chemical spatial distribution of hydrated in their native state at microscopic scale. By combining these scientific techniques, VP-SEM-dEDS is capable of providing a useful morpho-chemical characterization of any sample at microscopic, as a multidisciplinary field spanning life sciences, medicine, material science, industrial engineering, cultural heritage, etc.