Sonde Atomique Tomographique
Aix-Marseille Université
SAT allows preparing and characterizing,inorganic materials (e.g., metals, semiconductors and insulators) at both the atomic scale and in the three dimensions for applications in the fields of nanosciences, microelectronics and metallurgy.
PE3_10 - Nanophysics, e.g. nanoelectronics, nanophotonics, nanomagnetism, nanoelectromechanics - Condensed Matter Physics
PE11_9 - Nanomaterials engineering, e.g. nanoparticles, nanoporous materials, 1D & 2D nanomaterials - Materials Engineering
PE11_12 - Semi-conducting and magnetic materials engineering - Materials Engineering
Dual beam foccused ion beam (FIB)
atomic probe
materials nano-scale chemical analysis
metallurgy
SAT is open to scientific communities of both the academic and private sectors.
SAT consists of two main sets of equipments and related services:
-a sample preparation equipment by nano-machining, FIB, HELIOS 600 nanolab/FEI,
-a sample analysis equipment by laser-assisted tomographic atomic probe, LEAP 3000XHR/Cameca