1. Research Infrastructures
  2. Sonde Atomique Tomographique

Sonde Atomique Tomographique

CONTACT
Coordinates 43.29236346203756, 5.359133426541125
Contact name Khalid Hoummada
CIVIS Label No
Acronym SAT-PTA
Scientific domain

PE3_10 - Nanophysics, e.g. nanoelectronics, nanophotonics, nanomagnetism, nanoelectromechanics - Condensed Matter Physics


 

PE11_9 - Nanomaterials engineering, e.g. nanoparticles, nanoporous materials, 1D & 2D nanomaterials - Materials Engineering


 

PE11_12 - Semi-conducting and magnetic materials engineering - Materials Engineering


Keywords

Dual beam foccused ion beam (FIB)


 

atomic probe


 

materials nano-scale chemical analysis


 

metallurgy


Partner institution

Aix-Marseille Université


Website No
Technical staff available No
Remote access details SAT is open to scientific communities of both the academic and private sectors.
Remote access available No
Open to external users No
Equipment SAT consists of two main sets of equipments and related services: -a sample preparation equipment by nano-machining, FIB, HELIOS 600 nanolab/FEI, -a sample analysis equipment by laser-assisted tomographic atomic probe, LEAP 3000XHR/Cameca
Open access to updated information database No
Online booking system details Charte des Plateformes Technologiques Aix-Marseille (PTA): https://www.univ-amu.fr/system/files/2021-07/Charte%20PTF%20AMU%20M%C3%A0J21.docx.pdf
Online booking system available No
Description SAT allows preparing and characterizing,inorganic materials (e.g., metals, semiconductors and insulators) at both the atomic scale and in the three dimensions for applications in the fields of nanosciences, microelectronics and metallurgy.